Tan, Cher Ming,  1959- <br/><br/>
Electromigration in ULSI Interconnections / 
Cher Ming Tan. 
 - Singapore ;  World Scientific,  2010. 
 - xix, 291 p. :  ill. ;  24 cm. 
 - International series on advances in solid state electronics and technology .
 - International series on advances in solid state electronics and technology. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9789814273329 (hbk.)  RM302.94 9814273325 (hbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Ultra large scale integration.<br/>Electrodiffusion.