Kaschieva, S.,  1962- <br/><br/>
Radiation defects in ion implanted and/or high-energy irradiated MOS structures / 
S. Kaschieva and S.N. Dmitriev. 
 - New York :  Nova Science Publishers,  2010. 
 - ix, 195 p. :  ill. (some col.) ;  24 cm. 
 - Electrical engineering developments series. .
 - Electrical engineering developments series. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9781608761883 (hbk.)  RM261.13 1608761886 (hbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors.<br/>Semiconductor doping.<br/>Semiconductors--Effect of radiation on.<br/>Ion implantation.