TY  - BOOK
AU  - Fleetwood,D.M.
AU  - Pantelides,Sokrates T.
AU  - Schrimpf,Ronald Donald
TI  - Defects in microelectronic materials and devices
SN  - 9781420043761
U1  - 621.381 22
PY  - 2009///
CY  - Boca Raton
PB  - CRC Press
KW  - Microelectronics
KW  - Materials
KW  - Testing
KW  - Metal oxide semiconductor field-effect transistors
KW  - Integrated circuits
KW  - Defects
N1  - Access to 2http://www.egnetbase.com/ejournals/search/advsearch1.asp' and type the title. You may access the full text after you type in title in the advanced search screen; Includes bibliographical references and index
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UR  - http://www.engnetbase.com/ejournals/books/book_km.asp?id=7322
ER  -