TY  - BOOK
AU  - Head,A.K.
TI  - Computed electron micrographs and defect identification
SN  - 0720417570
PY  - 1973///
CY  - Amsterdam
PB  - North-Holland
KW  - Electronic data processing
KW  - Metals
KW  - Defects
KW  - Electron microscopy
ER  -