Computed electron micrographs and defect identification / 
A. K. Head ... [et al.] 
 - Amsterdam :  North-Holland,  1973 
 - x, 400 ;  23 cm. 
 - Defects in crystalline solids ;  vol. 7 .
<br/><br/><label>ISBN: </label>0720417570 
<br/><br/><label>LCCN: </label>72-93092 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic data processing--Metals--Defects<br/>Electronic data processing--Electron microscopy