TY  - BOOK
AU  - Cullis,A.G.
AU  - Midgley,P.A.
ED  - SpringerLink (Online service)
TI  - Microscopy of Semiconducting Materials 2007: proceedings of the 15th Conference, 2-5 April, 2007, Cambridge, UK 
SN  - 9781402086151 (electronic bk.)
U1  - 620.198 22
PY  - 2008///
CY  - Dordrecht
PB  - Springer Netherlands
KW  - Semiconductors
KW  - Congresses
KW  - Microscopy
KW  - Solid State Physics and Spectroscopy
KW  - Material Science
KW  - Electronics and Microelectronics, Instrumentation
KW  - Materials Science, general
KW  - Measurement Science, Instrumentation
UR  - https://eresourcesptsl.ukm.remotexs.co/user/login?url=http://link.springer.com.eresourcesptsl.ukm.remotexs.co/book/10.1007/978-1-4020-8615-1
ER  -