Microscopy of Semiconducting Materials 2007  proceedings of the 15th Conference, 2-5 April, 2007, Cambridge, UK /  [electronic resource] : 
edited by A. G. Cullis, P. A. Midgley. 
 - Dordrecht :  Springer Netherlands,  2008. 
 - xiv, 497 p. :  ill., digital ;  24 cm. 
 - Springer proceedings in physics,  120  0930-8989 ; .
<br/><br/><label>ISBN: </label>9781402086151 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Congresses.<br/>Microscopy--Congresses.<br/>Solid State Physics and Spectroscopy.<br/>Material Science.<br/>Electronics and Microelectronics, Instrumentation.<br/>Materials Science, general.<br/>Measurement Science, Instrumentation.
<br/><br/><label>Dewey Class. No.: </label>620.198