TY  - BOOK
AU  - Tehranipoor,Mohammad
ED  - SpringerLink (Online service)
TI  - Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability 
SN  - 9780387747477 (electronic bk.)
AV  - T174.7 .E44 2008
U1  - 620.5 22
PY  - 2008///
CY  - Boston, MA
PB  - Springer Science+Business Media, LLC
KW  - Nanotechnology
KW  - Microtechnology
KW  - Engineering
KW  - Circuits and Systems
KW  - Electronic and Computer Engineering
KW  - Electronics and Microelectronics, Instrumentation
KW  - Quality Control, Reliability, Safety and Risk
UR  - http://dx.doi.org/10.1007/978-0-387-74747-7
ER  -