Emerging Nanotechnologies  Test, Defect Tolerance, and Reliability /  [electronic resource] : 
edited by Mohammad Tehranipoor. 
 - Boston, MA :  Springer Science+Business Media, LLC,  2008. 
 - xii, 405 p. :  ill., digital ;  24 cm. 
 - Frontiers in Electronic Testing,  37  0929-1296 ; .
<br/><br/><label>ISBN: </label>9780387747477 (electronic bk.) 9780387747460 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanotechnology.<br/>Microtechnology.<br/>Engineering.<br/>Circuits and Systems.<br/>Electronic and Computer Engineering.<br/>Electronics and Microelectronics, Instrumentation.<br/>Nanotechnology.<br/>Quality Control, Reliability, Safety and Risk.
<br/><br/><label>LC Class. No.: </label>T174.7  / .E44 2008 
<br/><br/><label>Dewey Class. No.: </label>620.5