Pavlov, Andrei. <br/><br/>
CMOS SRAM circuit design and parametric test in nano-scaled technologies  process-aware SRAM design and test /  [electronic resource] : 
by Andrei Pavlov, Manoj Sachdev. 
 - Dordrecht :  Springer Science + Business Media B.V,  2008. 
 - 212 p. :  ill., digital ;  24 cm. 
 - Frontiers in electronic testing ;  40 .
<br/><br/><label>ISBN: </label>9781402083631 (electronic bk.) 9781402083624 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complementary--Design.<br/>Random access memory.<br/>Nanoelectronics.
<br/><br/><label>Dewey Class. No.: </label>621.38152