TY  - BOOK
AU  - Zhou,Weili
AU  - Wang,Zhong Lin
TI  - Scanning microscopy for nanotechnology: techniques and applications 
SN  - 9780387333250 (hbk.)
PY  - 2007///
CY  - New York
PB  - Springer
KW  - Scanning electron microscopy
KW  - Nanotechnology
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/enhancements/fy0823/2006925865-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0823/2006925865-t.html
ER  -