Scanning microscopy for nanotechnology :  techniques and applications / 
edited by Weilie Zhou and Zhong Lin Wang 
 - New York :  Springer,  2007 
 - xiv, 522 p., [12] p. of plates :  ill. (some col.) ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780387333250 (hbk.)  RM551.76 0387333258 (hbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy<br/>Nanotechnology