TY  - BOOK
AU  - Sachdev,Manoj
AU  - Gyvez,Jose Pineda de
ED  - SpringerLink (Online service)
TI  - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition 
SN  - 9780387465470 (electronic bk.)
AV  - TK7871.99.M44 S23 2007
U1  - 621.3815 22
PY  - 2007///
CY  - Boston, MA
PB  - Springer
UR  - https://eresourcesptsl.ukm.remotexs.co/login?url=http://dx.doi.org/10.1007/0-387-46547-2
ER  -