Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits  2nd Edition /  [electronic resource] : 
edited by Manoj Sachdev, Jose Pineda de Gyvez. 
 - Boston, MA :  Springer,  2007. 
 - 328 p. :  ill., digital ;  24 cm. 
 - Frontiers in Electronic Testing,  34  0929-1296 ; .
<br/><br/><label>ISBN: </label>9780387465470 (electronic bk.) 
<br/><br/><label>LC Class. No.: </label>TK7871.99.M44  / S23 2007 
<br/><br/><label>Dewey Class. No.: </label>621.3815