TY  - BOOK
AU  - Kalinin,Sergei
AU  - Gruverman,Alexei
ED  - SpringerLink (Online service)
TI  - Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale 
SN  - 9780387286686 (electronic bk.)
AV  - QH212.S33 S395 2007
U1  - 502.825 22
PY  - 2007///
CY  - New York, NY
PB  - Springer Science+Business Media, LLC
KW  - Scanning probe microscopy
KW  - Nanoelectronics
KW  - Chemistry
KW  - Characterization and Evaluation of Materials
KW  - Nanotechnology
KW  - Surfaces and Interfaces, Thin Films
KW  - Biological Microscopy
KW  - Mechanical Engineering
KW  - Solid State Physics and Spectroscopy
UR  - https://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-0-387-28668-6
ER  -