Scanning Probe Microscopy  Electrical and Electromechanical Phenomena at the Nanoscale /  [electronic resource] : 
edited by Sergei Kalinin, Alexei Gruverman. 
 - New York, NY :  Springer Science+Business Media, LLC,  2007. 
 - 1 v. (xx, 980 p., [8] p. of plates) :  ill. (some col.), digital ;  25 cm. 
<br/><br/><label>ISBN: </label>9780387286686 (electronic bk.) 9780387286679 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy.<br/>Nanoelectronics.<br/>Chemistry.<br/>Characterization and Evaluation of Materials.<br/>Nanotechnology.<br/>Surfaces and Interfaces, Thin Films.<br/>Biological Microscopy.<br/>Mechanical Engineering.<br/>Solid State Physics and Spectroscopy.
<br/><br/><label>LC Class. No.: </label>QH212.S33  / S395 2007 
<br/><br/><label>Dewey Class. No.: </label>502.825