TY  - BOOK
AU  - Aliev,Telman
ED  - SpringerLink (Online service)
TI  - Digital Noise Monitoring of Defect Origin
SN  - 9780387717548 (electronic bk.)
AV  - TK7867.5 .A45 2007
U1  - 621.38224 22
PY  - 2007///
CY  - Boston, MA
PB  - Springer Science+Business Media, LLC
KW  - Electronic noise
KW  - Mathematical models
KW  - Information storage and retrieval systems
KW  - Materials
KW  - Defects
KW  - Signal detection
KW  - Defect correction methods (Numerical analysis)
UR  - https://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-0-387-71754-8
ER  -