Aliev, Telman. <br/><br/>
Digital Noise Monitoring of Defect Origin  [electronic resource] / 
by Telman Aliev. 
 - Boston, MA :  Springer Science+Business Media, LLC,  2007. 
 - xii, 223 p. :  ill., digital ;  24 cm. 
<br/><br/><label>ISBN: </label>9780387717548 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic noise--Mathematical models.<br/>Information storage and retrieval systems--Materials--Defects.<br/>Signal detection.<br/>Defect correction methods (Numerical analysis)
<br/><br/><label>LC Class. No.: </label>TK7867.5  / .A45 2007 
<br/><br/><label>Dewey Class. No.: </label>621.38224