Sirenko, Yuriy K. <br/><br/>
Modeling and Analysis of Transient Processes in Open Resonant Structures  New Methods and Techniques /  [electronic resource] : 
by Yuriy K. Sirenko, Nataliya P. Yashina, Staffan Strom. 
 - New York, NY :  Springer,  2007. 
 - xiv, 353 p. :  ill., digital ;  25 cm. 
 - Springer Series in Optical Sciences,  122  0342-4111 ; .
<br/><br/><label>ISBN: </label>9780387325774 (electronic bk.) 9780387308784 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electromagnetic waves--Scattering--Mathematical models.<br/>Physics.<br/>Mathematical and Computational Physics.<br/>Applied Optics, Optoelectronics, Optical Devices.<br/>Microwaves, RF and Optical Engineering.<br/>Information and Communication, Circuits.