TY  - BOOK
AU  - Chiang,Charles C.
AU  - Kawa,Jamil
ED  - SpringerLink (Online service)
TI  - Design for Manufacturability and Yield for Nano-Scale CMOS
T2  - Series on Integrated Circuits and Systems,
SN  - 9781402051883 (electronic bk.)
U1  - 621.38 22
PY  - 2007///
CY  - Dordrecht
PB  - Springer
UR  - https://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-1-4020-5188-3
ER  -