Chiang, Charles C. <br/><br/>
Design for Manufacturability and Yield for Nano-Scale CMOS  [electronic resource] / 
by Charles C. Chiang, Jamil Kawa. 
 - Dordrecht :  Springer,  2007. 
 - 154 p. :  ill., digital ;  24 cm. 
 - Series on Integrated Circuits and Systems,  1558-9412 .
<br/><br/><label>ISBN: </label>9781402051883 (electronic bk.) 
<br/><br/><label>Dewey Class. No.: </label>621.38