TY  - BOOK
AU  - Kaupp,G.
ED  - SpringerLink (Online service)
TI  - Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces 
SN  - 9783540284727 (electronic bk.)
AV  - QH212.A78 K38 2006
U1  - 502.82 22
PY  - 2006///
CY  - Berlin, Heidelberg
PB  - Springer-Verlag Berlin Heidelberg
KW  - Genomics
KW  - Congresses
KW  - Pharmacogenomics
KW  - Drug development
KW  - Chemistry
KW  - Nanotechnology
KW  - Physics and Applied Physics in Engineering
KW  - Applied Optics, Optoelectronics, Optical Devices
KW  - Medical Biochemistry
KW  - Physical Chemistry
KW  - Life Sciences, general
UR  - https://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-3-540-28472-7
ER  -