Kaupp, G. <br/><br/>
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching  Application to Rough and Natural Surfaces /  [electronic resource] : 
by Gerd Kaupp. 
 - Berlin, Heidelberg :  Springer-Verlag Berlin Heidelberg,  2006. 
 - xii, 292 p. :  ill., digital ;  24 cm. 
<br/><br/><label>ISBN: </label>9783540284727 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Genomics--Congresses.<br/>Pharmacogenomics--Congresses.<br/>Drug development--Congresses.<br/>Chemistry.<br/>Nanotechnology.<br/>Physics and Applied Physics in Engineering.<br/>Applied Optics, Optoelectronics, Optical Devices.<br/>Medical Biochemistry.<br/>Physical Chemistry.<br/>Life Sciences, general.
<br/><br/><label>LC Class. No.: </label>QH212.A78  / K38 2006 
<br/><br/><label>Dewey Class. No.: </label>502.82