Foster, Adam. <br/><br/>
Scanning Probe Microscopy  Atomic Scale Engineering by Forces and Currents /  [electronic resource] : 
by Adam Foster, Werner Hofer. 
 - New York, NY :  Springer Science+Business Media, LLC,  2006. 
 - xiv, 281 pages :  illustration, digital ;  25 cm. 
 - NanoScience and Technology,  1434-4904 .
<br/><br/><label>ISBN: </label>9780387372310 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy.
<br/><br/><label>LC Class. No.: </label>QH212.S33  / F68 2006 
<br/><br/><label>Dewey Class. No.: </label>502.82