Da Silva, Francisco. <br/><br/>
The Core Test Wrapper Handbook  Rationale and Application of IEEE Std. 1500 /  [electronic resource] : 
by Francisco Da Silva, Teresa McLaurin, Tom Waayers. 
 - Boston, MA :  Springer Science+Business Media, LLC,  2006. 
 - xxviii, 276 pages :  illustration, digital ;  24 cm. 
 - Frontiers in Electronic Testing,  35  0929-1296 ; .
<br/><br/><label>ISBN: </label>9780387346090 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Embedded computer systems--Testing--Standards.<br/>Systems on a chip--Testing--Standards.<br/>Integrated circuits--Testing--Standards.<br/>Engineering.<br/>Electronic and Computer Engineering.<br/>Electronics and Microelectronics, Instrumentation.<br/>Computer-Aided Engineering (CAD, CAE) and Design.<br/>Circuits and Systems.
<br/><br/><label>LC Class. No.: </label>TK7895.E42  / D33 2006 
<br/><br/><label>Dewey Class. No.: </label>621.381