TY  - BOOK
AU  - Rein,Stefan
ED  - SpringerLink (Online service)
TI  - Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications 
SN  - 9783540279228 (electronic bk.)
AV  - TK7871.15.S55 R45 2005
U1  - 537 22
PY  - 2005///
CY  - Berlin, Heidelberg
PB  - Springer-Verlag Berlin Heidelberg
KW  - Silicon crystals
KW  - Defects
KW  - Spectra
KW  - Physics
KW  - Optical and Electronic Materials
KW  - Solid State Physics and Spectroscopy
UR  - https://eresourcesptsl.ukm.remotexs.co/login?url=http://dx.doi.org/10.1007/3-540-27922-9
ER  -