Rein, Stefan. <br/><br/>
Lifetime Spectroscopy  A Method of Defect Characterization in Silicon for Photovoltaic Applications /  [electronic resource] : 
by Stefan Rein. 
 - Berlin, Heidelberg :  Springer-Verlag Berlin Heidelberg,  2005. 
 - xxvi, 489 p. :  ill., digital ;  25 cm. 
 - Springer Series in Material Science,  85  0933-033X ; .
<br/><br/><label>ISBN: </label>9783540279228 (electronic bk.) 9783540253037 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Silicon crystals--Defects.<br/>Silicon crystals--Spectra.<br/>Physics.<br/>Optical and Electronic Materials.<br/>Solid State Physics and Spectroscopy.
<br/><br/><label>LC Class. No.: </label>TK7871.15.S55  / R45 2005 
<br/><br/><label>Dewey Class. No.: </label>537