TY  - BOOK
AU  - Huisman,Leendert M.
ED  - SpringerLink (Online service)
TI  - Data Mining and Diagnosing IC Fails
SN  - 9780387263519 (electronic bk.)
AV  - TK7874 .H85 2005
U1  - 621.381548 22
PY  - 2005///
CY  - Boston, MA
PB  - Springer Science+Business Media, Inc.
KW  - Integrated circuits
KW  - Testing
KW  - Statistical methods
KW  - Semiconductors
KW  - Failures
KW  - Data mining
KW  - Engineering
KW  - Electronics and Microelectronics, Instrumentation
KW  - Circuits and Systems
UR  - https://eresourcesptsl.ukm.remotexs.co/login?url=http://dx.doi.org/10.1007/b137446
ER  -