Huisman, Leendert M. <br/><br/>
Data Mining and Diagnosing IC Fails  [electronic resource] / 
by Leendert M. Huisman. 
 - Boston, MA :  Springer Science+Business Media, Inc.,  2005. 
 - 270 p. :  ill., digital ;  24 cm. 
 - Frontiers in Electronic Testing,  31  0929-1296 ; .
<br/><br/><label>ISBN: </label>9780387263519 (electronic bk.) 9780387249933 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Testing--Statistical methods.<br/>Semiconductors--Failures.<br/>Data mining.<br/>Engineering.<br/>Electronics and Microelectronics, Instrumentation.<br/>Circuits and Systems.
<br/><br/><label>LC Class. No.: </label>TK7874  / .H85 2005 
<br/><br/><label>Dewey Class. No.: </label>621.381548