Li, Flora M.. <br/><br/>
CCD Image Sensors in Deep-Ultraviolet  Degradation Behavior and Damage Mechanisms /  [electronic resource] : 
by Flora M. Li, Arokia Nathan. 
 - Berlin, Heidelberg :  Springer-Verlag Berlin Heidelberg,  2005. 
 - 1online resource (xi, 231 p.) :  ill., digital ;  25 cm. 
 - Microtechnology and Mems,  1615-8326 .
<br/><br/><label>ISBN: </label>9783540274124 (electronic bk.) 9783540226802 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Image processing--Digital techniques.<br/>Remote sensing.<br/>Service life (Engineering)<br/>Charge coupled devices.
<br/><br/><label>Dewey Class. No.: </label>621.364