Egerton, Ray F.. <br/><br/>
Physical Principles of Electron Microscopy  An Introduction to TEM, SEM, and AEM /  [electronic resource] : 
by Ray F. Egerton. 
 - Boston, MA :  Springer Science+Business Media, Inc.,  2005. 
 - xii, 202 p. :  ill., digital ;  25 cm. 
<br/><br/><label>ISBN: </label>9780387260167 (electronic bk.) 9780387258003 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy.<br/>Chemistry.<br/>Characterization and Evaluation Materials.<br/>Biological Microscopy.
<br/><br/><label>LC Class. No.: </label>QH212.E4  / E354 2005 
<br/><br/><label>Dewey Class. No.: </label>502.825