TY  - BOOK
AU  - Schroder,Dieter K.
TI  - Semiconductor material and device characterization
SN  - 0471739065 (acid-free paper)
PY  - 2006///
CY  - [Piscataway, NJ]
PB  - IEEE Press
KW  - Semiconductors
KW  - Testing
N1  - Wiley-Interscience; Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html
ER  -