Schroder, Dieter K. <br/><br/>
Semiconductor material and device characterization / 
Dieter K. Schroder. 
 - 3rd ed. 
 - [Piscataway, NJ] :  IEEE Press,  2006. 
 - xv, 779 p. :  ill. ;  25 cm. 
<br/><br/> Wiley-Interscience. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0471739065 (acid-free paper)  RM460.02 9780471739067 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors.<br/>Semiconductors--Testing.