The dissimilarity representation for pattern recognition : foundations and applications /
Elzbieta Pekalska, Robert P.W. Duin
- Hackensack, N.J. : World Scientific, 2005
- xxvi, 607 p. : ill. ; 24 cm.
- Series in machine perception and artificial intelligence ; v. 64 .
Includes bibliographical references (p. 561-597) and index