Sato, Yoshihiko <br/><br/>
Value analysis tear-down :  a new process for product development and innovation / 
Yoshihiko Sato and J. Jerry Kaufman 
 - New York :  Industrial Press,  2005 
 - x, 206 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references (p. 199) and index 
<br/><br/><label>ISBN: </label>0831132035 (professional/textbook : alk. paper)  RM156.87 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Value analysis (Cost control)<br/>Industrial productivity<br/>New products<br/>Engineering economy