Goodhew, Peter J. <br/><br/>
Electron microscopy and analysis / 
Peter J. Goodhew, John Humphreys, Richard Beanland 
 - 3rd ed. 
 - London :  Taylor & Francis,  2001 
 - x, 251 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references (p. [236]-237) and index 
<br/><br/><label>ISBN: </label>0748409688 (pbk.)  RM210.80 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy