TY  - BOOK
AU  - Birkholz,Mario
AU  - Fewster,Paul F.
AU  - Genzel,Christoph
TI  - Thin film analysis by x-ray scattering
SN  - 3527310525
PY  - 2006///
CY  - Weinheim
PB  - Wiley-VCH
KW  - Thin films
KW  - Analysis
KW  - X-ray spectroscopy
ER  -