Montrose, Mark I. <br/><br/>
Testing for EMC compliance :  approaches and techniques / 
Mark I. Montrose, Edward M. Nakauchi 
 - Hoboken, NJ :  John Wiley,  2004 
 - xviii, 460 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references (p. 447-451) and index 
<br/><br/><label>ISBN: </label>047143308X (cloth)  RM294.32 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electromagnetic compatibility<br/>Electromagnetic interference