TY  - BOOK
AU  - Damianou,Christakis Andrea
TI  - Characterization techniques for contaminated gate oxide
PY  - 1991///
CY  - Ann Arbor, Mich.
PB  - University Microfilms International
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Metal oxide semiconductors
N1  - Thesis (Ph.D.) - University of Arizona, 1990
ER  -