Damianou, Christakis Andrea <br/><br/>
Characterization techniques for contaminated gate oxide  [microform] / 
by Christakis Andrea Damianou 
 - Ann Arbor, Mich. :  University Microfilms International,  1991 
 - 1 microfiche ;  11 x 15 cm. 
<br/><br/>Thesis (Ph.D.) - University of Arizona, 1990 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration<br/>Metal oxide semiconductors