TY  - BOOK
AU  - Bonani,Fabrizio
AU  - Ghione,Giovanni
TI  - Noise in semiconductor devices: modeling and simulation 
SN  - 3540665838 (hc.)
PY  - 2001///
CY  - Berlin
PB  - Springer
KW  - Electronic noise
KW  - Mathematical models
KW  - Integrated circuits
KW  - Simulation methods
KW  - Semiconductors
N1  - Includes bibliographical references (p. [201]-208) and index
ER  -