Beck, Friedrich. <br/><br/>
Integrated circuit failure analysis :  a guide to preparation techniques / 
 A guide to preparation techniques. 
Friedrich Beck ; translated by Stephen S. Wilson. 
 - Chichester :  John Wiley & Sons,  1998. 
 - 173 p.  :  ill. ;  25 cm. 
 - Wiley series in quality and reliability engineering. .
<br/><br/><label>ISBN: </label>0471974013  RM273.16 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Failures.<br/>Semiconductors--Testing.