TY  - BOOK
AU  - Agrawal,Vishwani D.
AU  - Seth,Sharad C.
ED  - IEEE Computer Society
TI  - Tutorial, test generation for VLSI chips
SN  - 081868786X
PY  - 1988///
CY  - Washington, D.C.
PB  - IEEE computer Society
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Automatic checkout equipment
N1  - Bibliography : p. 333-394
ER  -