Jha, Niraj K. <br/><br/>
Testing and reliable design of CMOS circuits 
by Niraj K. Jha and Sandip Kundu 
 - Boston  Kluwer Academic Publishers  1990 
 - 231 p. :  ill. ;  24 cm. 
<br/><br/><label>ISBN: </label>0792390563 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complimentary--Testing<br/>Metal oxide semiconductors, Complimentary--Reliability<br/>Integrated circuits--Very large scale integration--Design and construction