TY  - BOOK
AU  - Hudli,Raghu Vishwanath
TI  - Testability analysis and test generation for sequential VLSI circuits (microform)
PY  - 1990///
CY  - Ann Arbor, Mich.
PB  - University Microfilms International
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
N1  - Thesis (Ph.D.)-University of Nebraska-Lincoln, 1990
ER  -