Signal processing and pattern recognition in nondestructive evaluation of materials 
Edited by C. H. Chen 
 - Berlin  Springer-Verlag  1988 
 - 344 p. : ill. ; 25 cm. 
 - NATO ASI series. Series F, Computer and systems sciences  v. 44 .
<br/><br/><label>ISBN: </label>3540191003 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Non-destructive testing--Congresses<br/>Signal processing--Congresses<br/>Pattern perception--Congresses