Secondary ion mass spectometry :  SIMS VI :  proceedings of the sixth international conference on secondary ion mass spectrometry (SMIS VI) :  palais des congres, Versailles, Paris, France September 13-18th, 1987 / 
editors A. Benninghoven ... (et al.). 
 - Chichester :  John Wiley & Sons  1988 
 - 1078 p. :  ill. ;  24 cm. 
<br/><br/><label>ISBN: </label>0471918326 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Secondary ion mass spectrometry--Congresses.