Scanning electron microscopy  1983, an international journal of scanning electron microscopy, related techniques, and applications 

 - Inc., AMF O'Hare (Chicago) Ill.  Scanning Electron Microscopy  1983 
 - 4 parts : ill. ; 29 cm. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopy, Electron, Scanning--Periodicals