Reliability and degradation  semiconductor devices and circuits/ 
edited by M.J.Howes, D.V.Morgan. 
 - Chichester:  John Wiley & Sons,  1981. 
 - 444p.;  23 cm. 
 - The Wiley series in solid state devices and circuits. .
<br/><br/><label>ISBN: </label>0471280283 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Reliability.