Practical scanning electron microscopy :  electron and ion microprobe analysis / 
edited by Joseph I. Goldstein and Harvey Yakowitz forward by T.E. Everhart. 
 - New York :  Plenum Press,  1975. 
 - 582 pages :  illustration ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0306308207 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopes<br/>Microprobe analysis<br/>Electron probe microanalysis<br/>Microscopy, Electron, Scanning